Atomic Force Microscope Dimension ICON
Device is for:
Device intended for topographic characterization and surface analysis of materials.
Atomic Force Microscope provides following options:
Microscope scans with tip and is able to accommodate large samples (up to 210 mm diameter and 15 mm thickness)
Position noise in „closed-loop" regime is lower than 0.15nm RMS
Microscope controller allows simultaneous collection of data from 8 bands, resolution 5Mpix
AFM modes: ScanAsyst, PeakForce Tapping, TappingMode (air), Contact Mode, Lateral Force Microscopy, PhaseImaging, Lift Mode, MFM, Force Spectroscopy, Force Volume, EFM, Surface Potential, Piezoresponse Microscopy
Microscope allows nanoindentation measurement with diamond pin.
contact person:
doc. Ing. et doc. Ing. Ivo Kuřitka, Ph.D. et Ph.D.
+420 57 603 8049 A418
This email address is being protected from spambots. You need JavaScript enabled to view it.
research
