Sample preparation kit for Leica electron microscopy EM TXP and Leica EM TIC 3X
Mechanical milling machine and polisher with diamond tools and ion-cutter with three argon ion bundles
contact person:
doc. Ing. et doc. Ing. Ivo Kuřitka, Ph.D. et Ph.D.
+420 57 603 8049 A418
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research
